Leslie B. Wilner

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Microelectromechanical pressure sensors
- Patent number 9,581,511
- Issue date Feb 28, 2017
- Meggitt (Orange County), Inc.
- Tom Kwa
- G01 - MEASURING TESTING
Information Patent Grant
Proof mass for maximized, bi-directional and symmetric damping in h...
- Patent number 8,191,420
- Issue date Jun 5, 2012
- Meggitt (San Juan Capistrano), Inc.
- Leslie Bruce Wilner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Silicon sensing structure to detect through-plane motion in a plane...
- Patent number 8,146,436
- Issue date Apr 3, 2012
- Meggitt (San Juan Capistrano), Inc.
- James Tjan-Meng Suminto
- G01 - MEASURING TESTING
Information Patent Grant
Interconnection system on a plane adjacent to a solid-state device...
- Patent number 8,115,265
- Issue date Feb 14, 2012
- Meggitt (San Juan Capistrano), Inc.
- Leslie Bruce Wilner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Highly sensitive piezoresistive element
- Patent number 8,096,188
- Issue date Jan 17, 2012
- Meggitt (San Juan Capistrano), Inc.
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Coupled pivoted acceleration sensors
- Patent number 7,987,716
- Issue date Aug 2, 2011
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Flexural pivot for micro-sensors
- Patent number 7,690,272
- Issue date Apr 6, 2010
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Highly sensitive piezoresistive element
- Patent number 7,594,440
- Issue date Sep 29, 2009
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Piezoresistive strain concentrator
- Patent number 7,392,716
- Issue date Jul 1, 2008
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Junction-isolated vias
- Patent number 7,276,794
- Issue date Oct 2, 2007
- Endevco Corporation
- Leslie B. Wilner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Piezoresistive strain concentrator
- Patent number 7,146,865
- Issue date Dec 12, 2006
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Piezoresistive strain concentrator
- Patent number 6,988,412
- Issue date Jan 24, 2006
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Thermal radiation sensor
- Patent number 6,670,538
- Issue date Dec 30, 2003
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Terminals for multi-layer devices
- Patent number 6,593,651
- Issue date Jul 15, 2003
- Endevco Corporation
- Leslie Bruce Wilner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Differential capacitive transducer and method of making
- Patent number 4,825,335
- Issue date Apr 25, 1989
- Endevco Corporation
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Piezoresistive transducer
- Patent number 4,793,194
- Issue date Dec 27, 1988
- Endevco Corporation
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Piezoresistive transducer
- Patent number 4,737,473
- Issue date Apr 12, 1988
- Endevco Corporation
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Piezoresistive transducer having frangible links
- Patent number 4,689,600
- Issue date Aug 25, 1987
- Allied Corporation
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Glass inlays for use in bonding semiconductor wafers
- Patent number 4,609,968
- Issue date Sep 2, 1986
- Becton, Dickinson and Company
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Piezoresistive transducer
- Patent number 4,605,919
- Issue date Aug 12, 1986
- Becton, Dickinson and Company
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive transducer
- Patent number 4,574,327
- Issue date Mar 4, 1986
- Becton, Dickinson and Company
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Piezoresistive transducer
- Patent number 4,498,229
- Issue date Feb 12, 1985
- Becton, Dickinson and Company
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Sculptured pressure diaphragm
- Patent number 4,093,933
- Issue date Jun 6, 1978
- Becton, Dickinson Electronics Company
- Leslie B. Wilner
- G01 - MEASURING TESTING
Information Patent Grant
Diffused semiconductor pressure gauge
- Patent number 4,065,970
- Issue date Jan 3, 1978
- Becton, Dickinson Electronics Company
- Leslie B. Wilner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROELECTROMECHANICAL PRESSURE SENSORS
- Publication number 20150101413
- Publication date Apr 16, 2015
- Meggitt (Orange County), Inc.
- TOM KWA
- G01 - MEASURING TESTING
Information Patent Application
Interconnection system on a plane adjacent to a solid-state device...
- Publication number 20120126351
- Publication date May 24, 2012
- Leslie Bruce Wilner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Proof mass for maximized, bi-directional and symmetric damping in h...
- Publication number 20110041608
- Publication date Feb 24, 2011
- Leslie Bruce Wilner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Highly sensitive piezoresistive element
- Publication number 20100139402
- Publication date Jun 10, 2010
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Application
Interconnection system on a plane adjacent to a solid-state device...
- Publication number 20090261432
- Publication date Oct 22, 2009
- Leslie Bruce Wilner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Coupled pivoted acceleration sensors
- Publication number 20090241669
- Publication date Oct 1, 2009
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Application
Silicon sensing structure to detect through-plane motion in a plane...
- Publication number 20090139338
- Publication date Jun 4, 2009
- James Tjan-Meng Suminto
- G01 - MEASURING TESTING
Information Patent Application
Flexural pivot for micro-sensors
- Publication number 20090084196
- Publication date Apr 2, 2009
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Application
Highly sensitive piezoresistive element
- Publication number 20080084269
- Publication date Apr 10, 2008
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Application
Junction-isolated vias
- Publication number 20060199365
- Publication date Sep 7, 2006
- Endevco Corporation
- Leslie B. Wilner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Piezoresistive strain concentrator
- Publication number 20060130596
- Publication date Jun 22, 2006
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Application
Piezoresistive strain concentrator
- Publication number 20060117871
- Publication date Jun 8, 2006
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Application
Thermal radiation sensor
- Publication number 20020139410
- Publication date Oct 3, 2002
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor
- Publication number 20020073783
- Publication date Jun 20, 2002
- Endevco Corporation
- Leslie Bruce Wilner
- G01 - MEASURING TESTING

Leslie B. Wilner

Person

Patents Grantslast 30 patents

Microelectromechanical pressure sensors

Proof mass for maximized, bi-directional and symmetric damping in h...

Silicon sensing structure to detect through-plane motion in a plane...

Interconnection system on a plane adjacent to a solid-state device...

Highly sensitive piezoresistive element

Coupled pivoted acceleration sensors

Flexural pivot for micro-sensors

Highly sensitive piezoresistive element

Piezoresistive strain concentrator

Junction-isolated vias

Piezoresistive strain concentrator

Piezoresistive strain concentrator

Thermal radiation sensor

Terminals for multi-layer devices

Differential capacitive transducer and method of making

Piezoresistive transducer

Piezoresistive transducer

Piezoresistive transducer having frangible links

Glass inlays for use in bonding semiconductor wafers

Piezoresistive transducer

Capacitive transducer

Piezoresistive transducer

Sculptured pressure diaphragm

Diffused semiconductor pressure gauge

Patents Applicationslast 30 patents

MICROELECTROMECHANICAL PRESSURE SENSORS

Interconnection system on a plane adjacent to a solid-state device...

Proof mass for maximized, bi-directional and symmetric damping in h...

Highly sensitive piezoresistive element

Interconnection system on a plane adjacent to a solid-state device...

Coupled pivoted acceleration sensors

Silicon sensing structure to detect through-plane motion in a plane...

Flexural pivot for micro-sensors

Highly sensitive piezoresistive element

Junction-isolated vias

Piezoresistive strain concentrator

Piezoresistive strain concentrator

Thermal radiation sensor

Pressure sensor