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Leslie J. Kirihara
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Richland, WA, US
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Patents Grants
last 30 patents
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Patent Grant
Methods and apparatus for multi-parameter acoustic signature inspec...
Patent number
7,246,522
Issue date
Jul 24, 2007
Battelle Memorial Institute
Aaron A. Diaz
G01 - MEASURING TESTING
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Patent Grant
Methods and systems for analyzing the degradation and failure of me...
Patent number
6,853,951
Issue date
Feb 8, 2005
Battelle Memorial Institute
Donald B. Jarrell
G05 - CONTROLLING REGULATING
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Patent Grant
Compact X-ray fluorescence spectrometer and method for fluid analysis
Patent number
6,668,039
Issue date
Dec 23, 2003
Battelle Memorial Institute
Chester L. Shepard
G01 - MEASURING TESTING
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Patent Grant
System for measuring film thickness
Patent number
4,956,558
Issue date
Sep 11, 1990
Battelle Memorial Institute
Charles R. Batishko
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Patents Applications
last 30 patents
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Patent Application
Methods and systems for analyzing the degradation and failure of me...
Publication number
20040030524
Publication date
Feb 12, 2004
Battelle Memorial Institute
Donald B. Jarrell
G05 - CONTROLLING REGULATING
Information
Patent Application
Compact X-ray fluorescence spectrometer and method for fluid analysis
Publication number
20030128805
Publication date
Jul 10, 2003
Chester L. Shepard
G01 - MEASURING TESTING