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Leslie JOHNSON
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Valatie, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Non-homogeneous sample handling apparatus and X-ray analyzer applic...
Patent number
9,360,440
Issue date
Jun 7, 2016
X-Ray Optical Systems, Inc.
George Allen
G01 - MEASURING TESTING
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Patent Grant
Compositions, methods of use and systems for analysis of silicon le...
Patent number
8,908,827
Issue date
Dec 9, 2014
X-Ray Optical Systems, Inc.
James Carnahan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
NON-HOMOGENEOUS SAMPLE HANDLING APPARATUS AND X-RAY ANALYZER APPLIC...
Publication number
20140270063
Publication date
Sep 18, 2014
X-Ray Optical Systems, Inc.
George ALLEN
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITIONS, METHODS OF USE AND SYSTEMS FOR ANALYSIS OF SILICON LE...
Publication number
20120321045
Publication date
Dec 20, 2012
X-Ray Optical Systems, Inc.
James CARNAHAN
G01 - MEASURING TESTING