Lesly Zaren Venturina Endrinal

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Visible alignment markers/landmarks for CAD-to-silicon backside ima...
- Patent number 10,605,859
- Issue date Mar 31, 2020
- QUALCOMM Incorporated
- Rami Salem
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-based integrated circuit testing techniques
- Patent number 10,324,131
- Issue date Jun 18, 2019
- QUALCOMM Incorporated
- Lesly Endrinal
- G01 - MEASURING TESTING
Information Patent Grant
Visible alignment markers/landmarks for CAD-to-silicon backside ima...
- Patent number 10,262,950
- Issue date Apr 16, 2019
- QUALCOMM Incorporated
- Michael Duane Alston
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Minimum voltage and maximum performance mapping using laser-assiste...
- Patent number 9,599,666
- Issue date Mar 21, 2017
- QUALCOMM Incorporated
- Lavakumar Ranganathan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VISIBLE ALIGNMENT MARKERS/LANDMARKS FOR CAD-TO-SILICON BACKSIDE IMA...
- Publication number 20190115301
- Publication date Apr 18, 2019
- QUALCOMM Incorporated
- Michael Duane ALSTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VISIBLE ALIGNMENT MARKERS/LANDMARKS FOR CAD-TO-SILICON BACKSIDE IMA...
- Publication number 20180074117
- Publication date Mar 15, 2018
- QUALCOMM Incorporated
- Rami SALEM
- G01 - MEASURING TESTING
Information Patent Application
MINIMUM VOLTAGE AND MAXIMUM PERFORMANCE MAPPING USING LASER-ASSISTE...
- Publication number 20160116531
- Publication date Apr 28, 2016
- QUALCOMM Incorporated
- Lavakumar Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TEMPERATURE CONTROLLED ELECTRICAL AND OPTICAL PROBE F...
- Publication number 20140361799
- Publication date Dec 11, 2014
- QUALCOMM Incorporated
- Armand Anthony Graupera
- G01 - MEASURING TESTING