Membership
Tour
Register
Log in
LESTER W. SCHULTHEIS
Follow
Person
SYKESVILLE, MD, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
Patent number
11,933,747
Issue date
Mar 19, 2024
University of Maryland, College Park
Peter Zavalij
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR IN-SITU X-RAY DIFFRACTION-BASED REAL-TIME MON...
Publication number
20230194445
Publication date
Jun 22, 2023
ADVANCED ANALYZER LABS, INC.
PETER ZAVALIJ
G01 - MEASURING TESTING