Lev Dulman

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Napa, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Interferometric topological metrology with pre-established referenc...
- Patent number 7,136,168
- Issue date Nov 14, 2006
- Angstrovision, Inc.
- Lev Dulman
- G01 - MEASURING TESTING
Information Patent Grant
Advanced signal processing technique for translating fringe line di...
- Patent number 6,999,181
- Issue date Feb 14, 2006
- Angstrovision, Inc.
- Lev Dulman
- G01 - MEASURING TESTING
Information Patent Grant
Inteferometric imaging system
- Patent number 4,957,367
- Issue date Sep 18, 1990
- Lev Dulman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for determining sample composition with an int...
- Publication number 20040027582
- Publication date Feb 12, 2004
- Lev Dulman
- G01 - MEASURING TESTING
Information Patent Application
Pre-established reference scale for interferometric topological met...
- Publication number 20040027583
- Publication date Feb 12, 2004
- Lev Dulman
- G01 - MEASURING TESTING
Information Patent Application
Advanced signal processing technique for translating fringe line di...
- Publication number 20040027584
- Publication date Feb 12, 2004
- Lev Dulman
- G01 - MEASURING TESTING
Information Patent Application
Interferometric topological metrology with pre-established referenc...
- Publication number 20040027581
- Publication date Feb 12, 2004
- Lev Dulman
- G01 - MEASURING TESTING