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Lev Sakin
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Stamford I, CT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Large field of view 2X magnification projection optical system for...
Patent number
7,405,802
Issue date
Jul 29, 2008
ASML Holding N.V.
Robert D. Harned
G02 - OPTICS
Information
Patent Grant
System and method utilizing a lithography tool having modular illum...
Patent number
7,242,456
Issue date
Jul 10, 2007
ASML Holdings N.V.
Lev Ryzhikov
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Imaging apparatus
Patent number
7,023,525
Issue date
Apr 4, 2006
ASML Netherlands B.V.
Arno Jan Bleeker
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Imaging apparatus
Patent number
6,778,257
Issue date
Aug 17, 2004
ASML Netherlands B.V.
Arno Jan Bleeker
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method, system, and computer program product for determining refrac...
Patent number
6,741,362
Issue date
May 25, 2004
ASML Holding N.V.
Stanislav Smirnov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System and method utilizing a lithography tool having modular illum...
Publication number
20050264782
Publication date
Dec 1, 2005
ASML Holding N.V.
Lev Ryzhikov
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Large field of view 2X magnification projection optical system for...
Publication number
20050237505
Publication date
Oct 27, 2005
ASML Holding N.V.
Robert D. Harned
G02 - OPTICS
Information
Patent Application
Imaging apparatus
Publication number
20040239909
Publication date
Dec 2, 2004
ASML NETHERLANDS B.V.
Arno Jan Bleeker
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Imaging apparatus
Publication number
20030030781
Publication date
Feb 13, 2003
ASML NETHERLANDS B.V.
Arno Jan Bleeker
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method, system, and computer program product for determining refrac...
Publication number
20020191193
Publication date
Dec 19, 2002
ASML US, Inc.
Stanislav Smirnov
G01 - MEASURING TESTING