Lewis A. Binns

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York, GB

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Patents Grantslast 30 patents

Information Patent Grant
Multilayer alignment and overlay target and measurement method
- Patent number 8,339,605
- Issue date Dec 25, 2012
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi layer alignment and overlay target and measurement method
- Patent number 8,107,079
- Issue date Jan 31, 2012
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi layer alignment and overlay target and measurement method
- Patent number 7,876,439
- Issue date Jan 25, 2011
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Imaging tool calibration artifact and method
- Patent number 7,473,502
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Chistopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi-layer alignment and overlay target and measurement method
- Patent number 7,474,401
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MULTILAYER ALIGNMENT AND OVERLAY TARGET AND MEASUREMENT METHOD
- Publication number 20110069314
- Publication date Mar 24, 2011
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI LAYER ALIGNMENT AND OVERLAY TARGET AND MEASUREMENT METHOD
- Publication number 20110058170
- Publication date Mar 10, 2011
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI LAYER ALIGNMENT AND OVERLAY TARGET AND MEASUREMENT METHOD
- Publication number 20080259334
- Publication date Oct 23, 2008
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Multi-layer Alignment and Overlay Target and Measurement Method
- Publication number 20070058169
- Publication date Mar 15, 2007
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY