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Li CHUNG-HSUN
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Eindhoven, NL
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Patents Grants
last 30 patents
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Patent Grant
Methods and apparatus for measuring a property of a substrate
Patent number
9,594,029
Issue date
Mar 14, 2017
ASML Netherlands B.V.
Wouter Lodewijk Elings
G05 - CONTROLLING REGULATING
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last 30 patents
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Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
Publication number
20170160073
Publication date
Jun 8, 2017
ASML NETHERLANDS B.V.
Wouter Lodewijk ELINGS
G01 - MEASURING TESTING
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Patent Application
Methods and Apparatus for Measuring A Property of a Substrate
Publication number
20140354969
Publication date
Dec 4, 2014
ASML NETHERLANDS B.V.
Wouter Lodewijk Elings
G01 - MEASURING TESTING