Li Danhong

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Guilderland, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Active, variable sample concentration method and apparatus for sub-...
- Patent number 10,317,350
- Issue date Jun 11, 2019
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Small spot and high energy resolution XRF system for valence state...
- Patent number 7,899,154
- Issue date Mar 1, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ACTIVE, VARIABLE SAMPLE CONCENTRATION METHOD AND APPARATUS FOR SUB-...
- Publication number 20170097311
- Publication date Apr 6, 2017
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE...
- Publication number 20100046702
- Publication date Feb 25, 2010
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING