Li Fan

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San Ramon, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe card assembly for testing electronic devices
- Patent number 9,588,139
- Issue date Mar 7, 2017
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Grant
Probe with cantilevered beam having solid and hollow sections
- Patent number 9,052,342
- Issue date Jun 9, 2015
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Grant
Single support structure probe group with staggered mounting pattern
- Patent number 8,203,352
- Issue date Jun 19, 2012
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Grant
Process of positioning groups of contact structures
- Patent number 8,148,646
- Issue date Apr 3, 2012
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device with two axes comb drive actuators
- Patent number 7,872,394
- Issue date Jan 18, 2011
- John Gritters
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Single support structure probe group with staggered mounting pattern
- Patent number 7,782,072
- Issue date Aug 24, 2010
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe Card Assembly For Testing Electronic Devices
- Publication number 20140327461
- Publication date Nov 6, 2014
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
Probe With Cantilevered Beam Having Solid And Hollow Sections
- Publication number 20130082729
- Publication date Apr 4, 2013
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
SINGLE SUPPORT STRUCTURE PROBE GROUP WITH STAGGERED MOUNTING PATTERN
- Publication number 20100315111
- Publication date Dec 16, 2010
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
Process For Manufacturing Contact Elements For Probe Card Assembles
- Publication number 20100140793
- Publication date Jun 10, 2010
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
Process of Positioning Groups of Contact Structures
- Publication number 20100078206
- Publication date Apr 1, 2010
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING
Information Patent Application
SINGLE SUPPORT STRUCTURE PROBE GROUP WITH STAGGERED MOUNTING PATTERN
- Publication number 20080074132
- Publication date Mar 27, 2008
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING