Li He

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Displays with reduced color non-uniformity
- Patent number 11,804,187
- Issue date Oct 31, 2023
- Apple Inc.
- Fang-Cheng Lin
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Accelerated training of a machine learning based model for semicond...
- Patent number 11,580,375
- Issue date Feb 14, 2023
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Training a machine learning model with synthetic images
- Patent number 11,170,255
- Issue date Nov 9, 2021
- KLA-Tencor Corp.
- Ian Riley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semi-supervised anomaly detection in scanning electron microscope i...
- Patent number 10,789,703
- Issue date Sep 29, 2020
- KLA-Tencor Corporation
- Shaoyu Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unified neural network for defect detection and classification
- Patent number 10,607,119
- Issue date Mar 31, 2020
- KLA-Tencor Corp.
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auxiliary power supply for a gate driver
- Patent number 10,530,236
- Issue date Jan 7, 2020
- OHIO STATE INNOVATION FOUNDATION
- Jin Wang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and system for defect classification
- Patent number 10,482,590
- Issue date Nov 19, 2019
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive automatic defect classification
- Patent number 10,436,720
- Issue date Oct 8, 2019
- KLA-Tenfor Corp.
- Li He
- G01 - MEASURING TESTING
Information Patent Grant
Driver system with an optical power based isolated power supply
- Patent number 10,193,547
- Issue date Jan 29, 2019
- OHIO STATE INNOVATION FOUNDATION
- Jin Wang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and system for iterative defect classification
- Patent number 9,922,269
- Issue date Mar 20, 2018
- KLA-Tencor Corporation
- Sankar Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect classification
- Patent number 9,898,811
- Issue date Feb 20, 2018
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Displays with Reduced Color Non-Uniformity
- Publication number 20220415271
- Publication date Dec 29, 2022
- Apple Inc.
- Fang-Cheng Lin
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
INTERPRETABLE DEEP LEARNING-BASED DEFECT DETECTION AND CLASSIFICATION
- Publication number 20220101114
- Publication date Mar 31, 2022
- KLA Corporation
- Xu Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHORT-CIRCUIT PROTECTION SOLUTION FOR POWER DEVICES
- Publication number 20210098982
- Publication date Apr 1, 2021
- Ohio State Innovation Foundation
- He Li
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND SYSTEM TO ACHIEVE FULLY REDUNDANT FAIL-SAFE SWITCH OFF P...
- Publication number 20200328660
- Publication date Oct 15, 2020
- NIO USA, INC
- Bo Guo
- B60 - VEHICLES IN GENERAL
Information Patent Application
TRAINING A MACHINE LEARNING MODEL WITH SYNTHETIC IMAGES
- Publication number 20190294923
- Publication date Sep 26, 2019
- KLA-Tencor Corporation
- Ian Riley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMI-SUPERVISED ANOMALY DETECTION IN SCANNING ELECTRON MICROSCOPE I...
- Publication number 20190287230
- Publication date Sep 19, 2019
- KLA-Tencor Corporation
- Shaoyu Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUXILIARY POWER SUPPLY FOR A GATE DRIVER
- Publication number 20190089237
- Publication date Mar 21, 2019
- Ohio State Innovation Foundation
- Jin Wang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
UNIFIED NEURAL NETWORK FOR DEFECT DETECTION AND CLASSIFICATION
- Publication number 20190073568
- Publication date Mar 7, 2019
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Defect Classification
- Publication number 20180114310
- Publication date Apr 26, 2018
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DRIVER SYSTEM WITH AN OPTICAL POWER BASED ISOLATED POWER SUPPLY
- Publication number 20170272158
- Publication date Sep 21, 2017
- Ohio State Innovation Foundation
- Jin Wang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...
- Publication number 20170193400
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Automatic Defect Classification
- Publication number 20170082555
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Li He
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Iterative Defect Classification
- Publication number 20160358041
- Publication date Dec 8, 2016
- KLA-Tencor Corporation
- Sankar Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Defect Classification
- Publication number 20160328837
- Publication date Nov 10, 2016
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Displays with reduced color non-uniformity

Accelerated training of a machine learning based model for semicond...

Training a machine learning model with synthetic images

Semi-supervised anomaly detection in scanning electron microscope i...

Unified neural network for defect detection and classification

Auxiliary power supply for a gate driver

Method and system for defect classification

Adaptive automatic defect classification

Driver system with an optical power based isolated power supply

Method and system for iterative defect classification

Method and system for defect classification

Patents Applicationslast 30 patents

Displays with Reduced Color Non-Uniformity

INTERPRETABLE DEEP LEARNING-BASED DEFECT DETECTION AND CLASSIFICATION

SHORT-CIRCUIT PROTECTION SOLUTION FOR POWER DEVICES

METHOD AND SYSTEM TO ACHIEVE FULLY REDUNDANT FAIL-SAFE SWITCH OFF P...

TRAINING A MACHINE LEARNING MODEL WITH SYNTHETIC IMAGES

SEMI-SUPERVISED ANOMALY DETECTION IN SCANNING ELECTRON MICROSCOPE I...

AUXILIARY POWER SUPPLY FOR A GATE DRIVER

UNIFIED NEURAL NETWORK FOR DEFECT DETECTION AND CLASSIFICATION

Method and System for Defect Classification

DRIVER SYSTEM WITH AN OPTICAL POWER BASED ISOLATED POWER SUPPLY

ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...

Adaptive Automatic Defect Classification

Method and System for Iterative Defect Classification

Method and System for Defect Classification