Li-Wei DENG

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Hsinchu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Test circuit and method for reading data from a memory device durin...
- Patent number 12,211,570
- Issue date Jan 28, 2025
- Realtek Semiconductor Corp.
- Li-Wei Deng
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing system and testing method
- Patent number 12,142,340
- Issue date Nov 12, 2024
- Realtek Semiconductor Corporation
- Shih-Chieh Lin
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Test circuit and method for reading data from a memory device durin...
- Publication number 20230335208
- Publication date Oct 19, 2023
- Realtek Semiconductor Corp.
- Li-Wei Deng
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING SYSTEM AND TESTING METHOD
- Publication number 20230230652
- Publication date Jul 20, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- Shih-Chieh LIN
- G11 - INFORMATION STORAGE