Lian-Fa Hung

Follow

Person

Tainan, TW

People

Patents Grantslast 30 patents

Information Patent Grant
High stress oxide to eliminate BPSG/SiN cracking
- Patent number 6,136,688
- Issue date Oct 24, 2000
- Vanguard International Semiconductor Corporation
- Keng-Chu Lin
- H01 - BASIC ELECTRIC ELEMENTS