Lian Tao

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical specimen analysis system and method
- Patent number 6,249,593
- Issue date Jun 19, 2001
- EY Laboratories, Inc.
- Albert E. Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical specimen analysis system and method
- Patent number 5,717,778
- Issue date Feb 10, 1998
- Albert E. Chu
- G06 - COMPUTING CALCULATING COUNTING