Liang Chen

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Woburn, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Shape measurement using microchip based fringe projection
- Patent number 8,922,780
- Issue date Dec 30, 2014
- Andover Photonics, Inc.
- Masoud Mohazzab
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic silicon modulator
- Patent number 8,149,493
- Issue date Apr 3, 2012
- Sifotonics Technologies (USA) Inc.
- Liang Chen
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SHAPE MEASUREMENT USING MICROCHIP BASED FRINGE PROJECTION
- Publication number 20100290060
- Publication date Nov 18, 2010
- Andover Photonics, Inc.
- Masoud Mohazzab
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTIC SILICON MODULATOR
- Publication number 20100060970
- Publication date Mar 11, 2010
- Sifotonics Technologies (USA) Inc.
- Liang Chen
- G02 - OPTICS