Liang-chi Chen

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Technique for determining circuit interdependencies
- Patent number 8,099,705
- Issue date Jan 17, 2012
- Oracle America, Inc.
- Paul J. Dickinson
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automated path delay test vector generation f...
- Patent number 7,640,476
- Issue date Dec 29, 2009
- Sun Microsystems Inc
- Daniel Watkins
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUE FOR DETERMINING CIRCUIT INTERDEPENDENCIES
- Publication number 20100281442
- Publication date Nov 4, 2010
- SUN MICROSYSTEMS, INC.
- Paul J. Dickinson
- G01 - MEASURING TESTING
Information Patent Application
Method and system for automated path delay test vector generation f...
- Publication number 20080092004
- Publication date Apr 17, 2008
- SUN MICROSYSTEMS, INC.
- Daniel Watkins
- G01 - MEASURING TESTING