Liangchen YE

Person

  • Shanghai, CN

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SCANNER CONTROL FOR LIDAR SYSTEMS

    • Publication number 20240377513
    • Publication date Nov 14, 2024
    • Hesai Technology Co., Ltd.
    • Yongfeng Gao
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHODS AND SYSTEMS FOR LIDAR AND LIDAR CONTROL

    • Publication number 20230375682
    • Publication date Nov 23, 2023
    • Hesai Technology Co., Ltd.
    • Fuwei HUANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCANNER CONTROL FOR LIDAR SYSTEMS

    • Publication number 20230341523
    • Publication date Oct 26, 2023
    • Hesai Technology Co., Ltd.
    • Yongfeng Gao
    • G01 - MEASURING TESTING
  • Information Patent Application

    DETECTION DEVICE AND METHOD FOR ADJUSTING PARAMETER THEREOF

    • Publication number 20220236392
    • Publication date Jul 28, 2022
    • HESAI PHOTONICS TECHNOLOGY CO., LTD.
    • Liangchen YE
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    DISTRIBUTED LASER RADAR

    • Publication number 20210278510
    • Publication date Sep 9, 2021
    • HESAI PHOTONICS TECHNOLOGY CO., LTD.
    • Zhengqing PAN
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISTRIBUTED LASER RADAR

    • Publication number 20210011138
    • Publication date Jan 14, 2021
    • HESAI PHOTONICS TECHNOLOGY CO., LTD.
    • Zhengqing PAN
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCANNER CONTROL FOR LIDAR SYSTEMS

    • Publication number 20200355803
    • Publication date Nov 12, 2020
    • HESAI PHOTONICS TECHNOLOGY CO., LTD.
    • Yongfeng Gao
    • G01 - MEASURING TESTING
  • Information Patent Application

    DETECTION DEVICE AND METHOD FOR ADJUSTING PARAMETER THEREOF

    • Publication number 20200348402
    • Publication date Nov 5, 2020
    • HESAI PHOTONICS TECHNOLOGY CO., LTD.
    • Liangchen YE
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIDAR SYSTEM AND METHOD

    • Publication number 20190113622
    • Publication date Apr 18, 2019
    • HESAI PHOTONICS TECHNOLOGY CO., LTD.
    • Shixiang WU
    • G01 - MEASURING TESTING