Liangjiang YU

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fully automated SEM sampling system for e-beam image enhancement
- Patent number 11,769,317
- Issue date Sep 26, 2023
- ASML Netherlands B.V.
- Wentian Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image enhancement for multi-layered structure in charged-particle b...
- Patent number 11,694,312
- Issue date Jul 4, 2023
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...
- Publication number 20250005739
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Shengcheng JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...
- Publication number 20250003899
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION
- Publication number 20240331132
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE DISTORTION CORRECTION IN CHARGED PARTICLE INSPECTION
- Publication number 20240331115
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING-BASED SYSTEMS AND METHODS FOR GENERATING SYNTHETIC...
- Publication number 20240062362
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Zhe WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT
- Publication number 20240046620
- Publication date Feb 8, 2024
- ASML NETHERLANDS B.V.
- Wentian ZHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ENHANCEMENT FOR MULTI-LAYERED STRUCTURE IN CHARGED-PARTICLE B...
- Publication number 20210350507
- Publication date Nov 11, 2021
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT
- Publication number 20200211178
- Publication date Jul 2, 2020
- ASML NETHERLANDS B.V.
- Wentian ZHOU
- G06 - COMPUTING CALCULATING COUNTING

Liangjiang YU

Person

Patents Grantslast 30 patents

Fully automated SEM sampling system for e-beam image enhancement

Image enhancement for multi-layered structure in charged-particle b...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...

METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...

METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION

IMAGE DISTORTION CORRECTION IN CHARGED PARTICLE INSPECTION

MACHINE LEARNING-BASED SYSTEMS AND METHODS FOR GENERATING SYNTHETIC...

FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT

IMAGE ENHANCEMENT FOR MULTI-LAYERED STRUCTURE IN CHARGED-PARTICLE B...

FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT