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Libor Kovarik
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West Richland, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Universal liquid sample device and process for high resolution tran...
Patent number
10,598,609
Issue date
Mar 24, 2020
Battelle Memorial Institute
Xiao-Ying Yu
G01 - MEASURING TESTING
Information
Patent Grant
Compressive scanning spectroscopy
Patent number
10,580,614
Issue date
Mar 3, 2020
Battelle Memorial Institute
Andrew J. Stevens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensing analytical instrument parameters, specimen characteristics,...
Patent number
10,541,109
Issue date
Jan 21, 2020
Battelle Memorial Institute
Bryan A. Stanfill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sparse sampling methods and probe systems for analytical instruments
Patent number
10,431,419
Issue date
Oct 1, 2019
Battelle Memorial Institute
Libor Kovarik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optimized sub-sampling in an electron microscope
Patent number
10,256,072
Issue date
Apr 9, 2019
Battelle Memorial Institute
Andrew J. Stevens
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Compressive transmission microscopy
Patent number
10,224,175
Issue date
Mar 5, 2019
Battelle Memorial Institute
Andrew J. Stevens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
TEM phase contrast imaging with image plane phase grating
Patent number
10,170,274
Issue date
Jan 1, 2019
Battelle Memorial Institute
Andrew J. Stevens
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam masks for compressive sensors
Patent number
10,109,453
Issue date
Oct 23, 2018
Battelle Memorial Institute
Andrew J. Stevens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
OPTIMIZED SUB-SAMPLING IN AN ELECTRON MICROSCOPE
Publication number
20190043690
Publication date
Feb 7, 2019
Battelle Memorial Institute
Andrew J. Stevens
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SENSING ANALYTICAL INSTRUMENT PARAMETERS, SPECIMEN CHARACTERISTICS,...
Publication number
20180033591
Publication date
Feb 1, 2018
Battelle Memorial Institute
Bryan A. Stanfill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS
Publication number
20180025887
Publication date
Jan 25, 2018
Battelle Memorial Institute
Libor Kovarik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPRESSIVE SCANNING SPECTROSCOPY
Publication number
20170316916
Publication date
Nov 2, 2017
Battelle Memorial Institute
Andrew J. Stevens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
UNIVERSAL LIQUID SAMPLE DEVICE AND PROCESS FOR HIGH RESOLUTION TRAN...
Publication number
20170213692
Publication date
Jul 27, 2017
Battelle Memorial Institute
Xiao-Ying Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEM PHASE CONTRAST IMAGING WITH IMAGE PLANE PHASE GRATING
Publication number
20170025247
Publication date
Jan 26, 2017
Battelle Memorial Institute
Andrew J. Stevens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON BEAM MASKS FOR COMPRESSIVE SENSORS
Publication number
20160276050
Publication date
Sep 22, 2016
Battelle Memorial Institute
Andrew J. Stevens
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
COMPRESSIVE TRANSMISSION MICROSCOPY
Publication number
20160276129
Publication date
Sep 22, 2016
Battelle Memorial Institute
Andrew J. Stevens
H01 - BASIC ELECTRIC ELEMENTS