Libor Novak

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Broad ion beam (BIB) systems for more efficient processing of multi...
- Patent number 12,228,484
- Issue date Feb 18, 2025
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid shaping with charged particle beams
- Patent number 12,216,029
- Issue date Feb 4, 2025
- FEI Company
- Libor Novak
- G01 - MEASURING TESTING
Information Patent Grant
Inert gas sample transfer for beam systems
- Patent number 12,183,539
- Issue date Dec 31, 2024
- FEI Company
- Libor Novák
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and methods for automated processing of multiple samples in...
- Patent number 12,165,833
- Issue date Dec 10, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for pre-aligning samples for more efficient pro...
- Patent number 12,106,931
- Issue date Oct 1, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for positioning and transferring a sample
- Patent number 12,000,789
- Issue date Jun 4, 2024
- FEI Company
- Libor Novak
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device for inspection of a specimen with a pl...
- Patent number 11,676,795
- Issue date Jun 13, 2023
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contactless temperature measurement in a charged particle microscope
- Patent number 10,134,563
- Issue date Nov 20, 2018
- FEI Company
- Jacob Simon Faber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Environmental cell for charged particle beam system
- Patent number 9,679,741
- Issue date Jun 13, 2017
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CRYOGENIC CLEANING DEVICE
- Publication number 20250108317
- Publication date Apr 3, 2025
- FEI Company
- Jan Lásko
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE SENSORS INCLUDING WIDE BANDGAP MATERIALS
- Publication number 20240194442
- Publication date Jun 13, 2024
- FEI Company
- Branislav Straka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED LASER AND BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT...
- Publication number 20230420216
- Publication date Dec 28, 2023
- FEI Company
- Krishna Kanth NEELISETTY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTI...
- Publication number 20230375445
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHODS FOR AUTOMATED PROCESSING OF MULTIPLE SAMPLES IN...
- Publication number 20230377833
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...
- Publication number 20230377834
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INERT GAS SAMPLE TRANSFER FOR BEAM SYSTEMS
- Publication number 20230245850
- Publication date Aug 3, 2023
- FEI Company
- Libor Novák
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR POSITIONING AND TRANSFERRING A SAMPLE
- Publication number 20230204525
- Publication date Jun 29, 2023
- FEI Company
- Libor NOVAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID SHAPING WITH CHARGED PARTICLE BEAMS
- Publication number 20220381654
- Publication date Dec 1, 2022
- FEI Company
- Libor NOVAK
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20210296088
- Publication date Sep 23, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNET USED WITH A PLASMA CLEANER
- Publication number 20180053638
- Publication date Feb 22, 2018
- FEI Company
- Viktor Svéda
- B08 - CLEANING
Information Patent Application
INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE M...
- Publication number 20170103868
- Publication date Apr 13, 2017
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20160133436
- Publication date May 12, 2016
- FEI Company
- Jacob Simon Faber
- G01 - MEASURING TESTING
Information Patent Application
Environmental Cell for Charged Particle Beam System
- Publication number 20120112062
- Publication date May 10, 2012
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS

Libor Novak

Person

Patents Grantslast 30 patents

Broad ion beam (BIB) systems for more efficient processing of multi...

Liquid shaping with charged particle beams

Inert gas sample transfer for beam systems

System and methods for automated processing of multiple samples in...

Systems and methods for pre-aligning samples for more efficient pro...

Method and system for positioning and transferring a sample

Charged particle beam device for inspection of a specimen with a pl...

Contactless temperature measurement in a charged particle microscope

Environmental cell for charged particle beam system

Patents Applicationslast 30 patents

CRYOGENIC CLEANING DEVICE

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

CHARGED PARTICLE SENSORS INCLUDING WIDE BANDGAP MATERIALS

COMBINED LASER AND BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT...

BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTI...

SYSTEM AND METHODS FOR AUTOMATED PROCESSING OF MULTIPLE SAMPLES IN...

SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...

INERT GAS SAMPLE TRANSFER FOR BEAM SYSTEMS

METHOD AND SYSTEM FOR POSITIONING AND TRANSFERRING A SAMPLE

LIQUID SHAPING WITH CHARGED PARTICLE BEAMS

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

MAGNET USED WITH A PLASMA CLEANER

INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE M...

CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

Environmental Cell for Charged Particle Beam System