Lich Tran

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probes for a wafer test apparatus
- Patent number 7,808,260
- Issue date Oct 5, 2010
- Kulicke and Soffa Industries, Inc.
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card
- Patent number 7,679,383
- Issue date Mar 16, 2010
- SV Probe Pte. Ltd.
- Lich Thanh Tran
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe Head Including a Guide Plate with Angled Holes to Determine P...
- Publication number 20220236304
- Publication date Jul 28, 2022
- Sterling Tadashi Collins
- G01 - MEASURING TESTING
Information Patent Application
Probes for a Wafer Test Apparatus
- Publication number 20080258746
- Publication date Oct 23, 2008
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probe card
- Publication number 20080204062
- Publication date Aug 28, 2008
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Application
Reinforced probes for testing semiconductor devices
- Publication number 20060028220
- Publication date Feb 9, 2006
- K&S Interconnect, Inc.
- Edward L. Malantonio
- G01 - MEASURING TESTING