Lichun Feng

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring thickness by pulsed infrared thermal wave tech...
- Patent number 9,464,891
- Issue date Oct 11, 2016
- Capital Normal University
- Zhi Zeng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING THICKNESS BY PULSED INFRARED THERMAL WAVE TECH...
- Publication number 20140153608
- Publication date Jun 5, 2014
- CAPITAL NORMAL UNIVERSITY
- Zhi Zeng
- G01 - MEASURING TESTING