Lie-Quan Lee

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Loosely-coupled inspection and metrology system for high-volume pro...
- Patent number 11,562,289
- Issue date Jan 24, 2023
- KLA Corporation
- Song Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic wavelength or angle pruning for optical metrology
- Patent number 11,175,589
- Issue date Nov 16, 2021
- KLA Corporation
- Lie-Quan Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic selection of sample values for optical metrology
- Patent number 10,895,810
- Issue date Jan 19, 2021
- KLA Corporation
- Meng Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement library optimization in semiconductor metrology
- Patent number 10,732,520
- Issue date Aug 4, 2020
- KLA-Tencor Corporation
- Meng Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automated metrology system selection
- Patent number 10,502,692
- Issue date Dec 10, 2019
- KLA-Tencor Corporation
- Meng Cao
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic removal of correlation of highly correlated parameters for...
- Patent number 10,386,729
- Issue date Aug 20, 2019
- KLA-Tencor Corporation
- Lie-Quan Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement library optimization in semiconductor metrology
- Patent number 10,345,721
- Issue date Jul 9, 2019
- KLA-Tencor Corporation
- Meng Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Model optimization approach based on spectral sensitivity
- Patent number 10,255,385
- Issue date Apr 9, 2019
- KLA-Tencor Corporation
- Stilian Ivanov Pandev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accurate and fast neural network training for library-based critica...
- Patent number 9,607,265
- Issue date Mar 28, 2017
- KLA-Tencor Corporation
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device models including re-usable sub-structures
- Patent number 9,553,033
- Issue date Jan 24, 2017
- KLA-Tencor Corporation
- Jonathan Iloreta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Meta-model based measurement refinement
- Patent number 9,347,872
- Issue date May 24, 2016
- KLA-Tencor Corporation
- Leonid Poslavsky
- G01 - MEASURING TESTING
Information Patent Grant
Accurate and fast neural network training for library-based critica...
- Patent number 8,577,820
- Issue date Nov 5, 2013
- Tokyo Electron Limited
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Fleet Matching Of Semiconductor Metrology Tools Without Dedicated Q...
- Publication number 20210375651
- Publication date Dec 2, 2021
- KLA Corporation
- Song Wu
- G01 - MEASURING TESTING
Information Patent Application
Loosely-Coupled Inspection and Metrology System for High-Volume Pro...
- Publication number 20200184372
- Publication date Jun 11, 2020
- KLA-Tencor Corporation
- Song Wu
- G01 - MEASURING TESTING
Information Patent Application
Automated Metrology System Selection
- Publication number 20170023491
- Publication date Jan 26, 2017
- KLA-Tencor Corporation
- Meng Cao
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device Models Including Re-Usable Sub-Structures
- Publication number 20150199463
- Publication date Jul 16, 2015
- KLA-Tencor Corporation
- Jonathan Iloreta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC SELECTION OF SAMPLE VALUES FOR OPTICAL METROLOGY
- Publication number 20150142395
- Publication date May 21, 2015
- Meng Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC REMOVAL OF CORRELATION OF HIGHLY CORRELATED PARAMETERS FOR...
- Publication number 20140358488
- Publication date Dec 4, 2014
- Lie-Quan Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AUTOMATIC WAVELENGTH OR ANGLE PRUNING FOR OPTICAL METROLOGY
- Publication number 20140358485
- Publication date Dec 4, 2014
- Lie-Quan Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ACCURATE AND FAST NEURAL NETWORK TRAINING FOR LIBRARY-BASED CRITICA...
- Publication number 20140032463
- Publication date Jan 30, 2014
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODEL OPTIMIZATION APPROACH BASED ON SPECTRAL SENSITIVITY
- Publication number 20130262044
- Publication date Oct 3, 2013
- Stilian Ivanov Pandev
- G01 - MEASURING TESTING
Information Patent Application
LIBRARY GENERATION WITH DERIVATIVES IN OPTICAL METROLOGY
- Publication number 20130158957
- Publication date Jun 20, 2013
- Lie-Quan Lee
- G01 - MEASURING TESTING
Information Patent Application
Accurate and Fast Neural network Training for Library-Based Critica...
- Publication number 20120226644
- Publication date Sep 6, 2012
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING

Lie-Quan Lee

Person

Patents Grantslast 30 patents

Loosely-coupled inspection and metrology system for high-volume pro...

Automatic wavelength or angle pruning for optical metrology

Automatic selection of sample values for optical metrology

Measurement library optimization in semiconductor metrology

Automated metrology system selection

Dynamic removal of correlation of highly correlated parameters for...

Measurement library optimization in semiconductor metrology

Model optimization approach based on spectral sensitivity

Accurate and fast neural network training for library-based critica...

Semiconductor device models including re-usable sub-structures

Meta-model based measurement refinement

Accurate and fast neural network training for library-based critica...

Patents Applicationslast 30 patents

Fleet Matching Of Semiconductor Metrology Tools Without Dedicated Q...

Loosely-Coupled Inspection and Metrology System for High-Volume Pro...

Automated Metrology System Selection

Semiconductor Device Models Including Re-Usable Sub-Structures

AUTOMATIC SELECTION OF SAMPLE VALUES FOR OPTICAL METROLOGY

DYNAMIC REMOVAL OF CORRELATION OF HIGHLY CORRELATED PARAMETERS FOR...

AUTOMATIC WAVELENGTH OR ANGLE PRUNING FOR OPTICAL METROLOGY

ACCURATE AND FAST NEURAL NETWORK TRAINING FOR LIBRARY-BASED CRITICA...

MODEL OPTIMIZATION APPROACH BASED ON SPECTRAL SENSITIVITY

LIBRARY GENERATION WITH DERIVATIVES IN OPTICAL METROLOGY

Accurate and Fast Neural network Training for Library-Based Critica...