Lien-Sheng Yang

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Device for detecting defective global word line
- Patent number 9,153,344
- Issue date Oct 6, 2015
- Integrated Circuit Solution Inc.
- Lien-Sheng Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of detecting connection defects of memory and memory capable...
- Patent number 8,773,931
- Issue date Jul 8, 2014
- Etron Technology, Inc.
- Min-Chih Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of performing a chip burn-in scanning with increased efficiency
- Patent number 8,543,877
- Issue date Sep 24, 2013
- Etron Technology, Inc.
- Wei-Ju Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line defect detecting device and method thereof
- Patent number 7,965,577
- Issue date Jun 21, 2011
- Etron Technology, Inc.
- Wei-Jen Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for detecting erroneous word lines of a memory array and dev...
- Patent number 7,623,388
- Issue date Nov 24, 2009
- Etron Technology, Inc.
- Tzu-Hao Chen
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method of Detecting Connection Defects of Memory and Memory Capable...
- Publication number 20130010558
- Publication date Jan 10, 2013
- Min-Chih Chang
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF performing A CHIP BURN-IN SCANNING with increased EFFICIENCY
- Publication number 20120131398
- Publication date May 24, 2012
- Wei-Ju Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Word line defect detecting device and method thereof
- Publication number 20100329052
- Publication date Dec 30, 2010
- Wei-Jen Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Method for detecting erroneous word lines of a memory array and dev...
- Publication number 20090175097
- Publication date Jul 9, 2009
- Tzu-Hao Chen
- G11 - INFORMATION STORAGE