Lien-Sheng YANG

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for detecting abnormal die
- Patent number 11,378,620
- Issue date Jul 5, 2022
- Integrated Silicon Solution Inc.
- Shou-Kang Fan
- G01 - MEASURING TESTING
Information Patent Grant
Memory inspecting method and memory inspecting system
- Patent number 11,195,592
- Issue date Dec 7, 2021
- Integrated Silicon Solution Inc.
- PaiLu Dennis Wang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR DETECTING ABNORMAL DIE
- Publication number 20210349147
- Publication date Nov 11, 2021
- Integrated Silicon Solution Inc.
- Shou-Kang FAN
- G01 - MEASURING TESTING
Information Patent Application
MEMORY INSPECTING METHOD AND MEMORY INSPECTING SYSTEM
- Publication number 20210257042
- Publication date Aug 19, 2021
- Integrated Silicon Solution Inc.
- PaiLu Dennis WANG
- G11 - INFORMATION STORAGE