Lieve Govaerts

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Heverlee, BE

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Patents Grantslast 30 patents

Information Patent Grant
Detecting semiconductor substrate anomalies
- Patent number 8,379,964
- Issue date Feb 19, 2013
- KLA-Tencor Corporation
- Dominque Janssens
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING EFFICIENCY IMPACT OF INTERRUPT...
- Publication number 20130035881
- Publication date Feb 7, 2013
- KLA-Tencor Corporation
- Choon (George) Hoong Hoo
- G01 - MEASURING TESTING
Information Patent Application
Detecting Semiconductor Substrate Anomalies
- Publication number 20110123091
- Publication date May 26, 2011
- ICOS VISION SYSTEMS NV
- Dominque Janssens
- G06 - COMPUTING CALCULATING COUNTING