Lifeng Levin Zhang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Cost-saving scheme for scan testing of 3D stack die
- Patent number 12,099,091
- Issue date Sep 24, 2024
- Advanced Micro Devices, Inc.
- Songgan Zang
- G01 - MEASURING TESTING
Information Patent Grant
Application crash resist method and apparatus
- Patent number 7,827,444
- Issue date Nov 2, 2010
- Intel Corporation
- Lifeng Levin Zhang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COST-SAVING SCHEME FOR SCAN TESTING OF 3D STACK DIE
- Publication number 20240019493
- Publication date Jan 18, 2024
- ADVANCED MICRO DEVICES, INC.
- SongGan Zang
- G01 - MEASURING TESTING
Information Patent Application
Application crash resist method and apparatus
- Publication number 20090089621
- Publication date Apr 2, 2009
- Intel Corporation
- Lifeng Levin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Anti-virus usage model at an exterior panel of a computer
- Publication number 20090019388
- Publication date Jan 15, 2009
- Lifeng Zhang
- G06 - COMPUTING CALCULATING COUNTING