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last 30 patents
Information
Patent Grant
Instrument calibration device and calibration method using same
Patent number
11,262,229
Issue date
Mar 1, 2022
Beijing Const Instruments Technology Inc.
Shichun Zhao
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Combination test method by using argon as gross-leak test tracer ga...
Patent number
10,254,192
Issue date
Apr 9, 2019
Genglin Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method for helium mass spectrometric fine-leak test based on quanti...
Patent number
9,671,308
Issue date
Jun 6, 2017
BEIJING KEYTON ELECTRONIC RELAY CORPORATION LTD.
Genglin Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Instrument Calibration Device And Calibration Method Using Same
Publication number
20200319012
Publication date
Oct 8, 2020
BEIJING CONST INSTRUMENTS TECHNOLOGY INC.
Shichun Zhao
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
COMBINATION TEST METHOD BY USING ARGON AS GROSS-LEAK TEST TRACER GA...
Publication number
20160313207
Publication date
Oct 27, 2016
Genglin WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR HELIUM MASS SPECTROMETRIC FINE-LEAK TEST BASED ON QUANTI...
Publication number
20140222353
Publication date
Aug 7, 2014
Genglin Wang
G01 - MEASURING TESTING