Lilach Saltoun

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Qiriat Ono, IL

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Patents Grantslast 30 patents

Information Patent Grant
Wavelet system and method for ameliorating misregistration and asym...
- Patent number 12,080,610
- Issue date Sep 3, 2024
- KLA Corporation
- Lilach Saltoun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Accuracy improvements in optical metrology
- Patent number 11,862,522
- Issue date Jan 2, 2024
- Barak Bringoltz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Per-site residuals analysis for accurate metrology measurements
- Patent number 11,249,400
- Issue date Feb 15, 2022
- KLA Corporation
- Lilach Saltoun
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing and utilizing landscapes to reduce or eliminate...
- Patent number 10,831,108
- Issue date Nov 10, 2020
- KLA Corporation
- Tal Marciano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Wavelet System and Method for Ameliorating Misregistration and Asym...
- Publication number 20220020649
- Publication date Jan 20, 2022
- KLA Corporation
- Lilach Saltoun
- G01 - MEASURING TESTING
Information Patent Application
ACCURACY IMPROVEMENTS IN OPTICAL METROLOGY
- Publication number 20210175132
- Publication date Jun 10, 2021
- KLA-Tencor Corporation
- Barak Bringoltz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PER-SITE RESIDUALS ANALYSIS FOR ACCURATE METROLOGY MEASUREMENTS
- Publication number 20200371445
- Publication date Nov 26, 2020
- KLA Corporation
- Lilach Saltoun
- G01 - MEASURING TESTING
Information Patent Application
ACCURACY IMPROVEMENTS IN OPTICAL METROLOGY
- Publication number 20180047646
- Publication date Feb 15, 2018
- KLA-Tencor Corporation
- Barak Bringoltz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF ANALYZING AND UTILIZING LANDSCAPES TO REDUCE OR ELIMINAT...
- Publication number 20160313658
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Tal Marciano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY