Lili HAN

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Ningde, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for defect detection
- Patent number 11,922,617
- Issue date Mar 5, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Annan Shu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing method
- Patent number 11,823,326
- Issue date Nov 21, 2023
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Guannan Jiang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE PROCESSING METHOD
- Publication number 20230281919
- Publication date Sep 7, 2023
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Guannan JIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DEFECT DETECTION
- Publication number 20230281785
- Publication date Sep 7, 2023
- Contemporary Amperex Technology Co., Limited
- Annan SHU
- G06 - COMPUTING CALCULATING COUNTING