LILUNG LAI

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor testing structures and semiconductor testing apparatus
- Patent number 9,823,271
- Issue date Nov 21, 2017
- Semiconductor Manufacturing International (Beijing) Corporation
- Nan Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
In-chip static-current device failure detecting methods and apparatus
- Patent number 9,606,173
- Issue date Mar 28, 2017
- Semiconductor Manufacturing International (Beijing) Corporation
- Jianfeng Pan
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing structures and fabrication method thereof
- Patent number 9,557,348
- Issue date Jan 31, 2017
- Semiconductor Manufacturing International (Beijing) Corporation
- Nan Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TESTING STRUCTURES AND SEMICONDUCTOR TESTING APPARATUS
- Publication number 20170016934
- Publication date Jan 19, 2017
- Semiconductor Manufacturing International (Beijing) Corporation
- Nan LI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING STRUCTURES AND FABRICATION METHOD THEREOF
- Publication number 20150316583
- Publication date Nov 5, 2015
- Semiconductor Manufacturing International (Beijing) Corporation
- NAN LI
- B32 - LAYERED PRODUCTS
Information Patent Application
IN-CHIP STATIC-CURRENT DEVICE FAILURE DETECTING METHODS AND APPARATUS
- Publication number 20150316601
- Publication date Nov 5, 2015
- Semiconductor Manufacturing International (Beijing) Corpor
- JIANFENG PAN
- G01 - MEASURING TESTING