Lim Hooi Weng

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Interface apparatus for semiconductor testing and method of manufac...
- Patent number 10,096,958
- Issue date Oct 9, 2018
- Spire Manufacturing Inc.
- Hai Dau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-die interface for semiconductor testing and method of manufac...
- Patent number 9,933,479
- Issue date Apr 3, 2018
- Spire Manufacturing
- Hai Dau
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi-die Interface for Semiconductor Testing and Method of Manufac...
- Publication number 20170131348
- Publication date May 11, 2017
- Hai Dau
- G01 - MEASURING TESTING
Information Patent Application
Interface Apparatus for Semiconductor Testing and Method of Manufac...
- Publication number 20170093101
- Publication date Mar 30, 2017
- Hai Dau
- H01 - BASIC ELECTRIC ELEMENTS