Lin Jing

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for inspecting a wafer
- Patent number 10,876,975
- Issue date Dec 29, 2020
- SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE. LTD.
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspecting a wafer
- Patent number 10,161,881
- Issue date Dec 25, 2018
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for automatically correcting for rotational misal...
- Patent number 10,128,140
- Issue date Nov 13, 2018
- Semiconductor Technologies & Instruments Pte Ltd
- Jing Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for automatically verifying correct die removal...
- Patent number 9,934,565
- Issue date Apr 3, 2018
- ASTI Holdings Limited
- Ajharali Amanullah
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Patterned wafer defect inspection system and method
- Patent number 8,401,272
- Issue date Mar 19, 2013
- ASTI Holdings Limited
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Grant
Localized annealing during semiconductor device fabrication
- Patent number 8,329,556
- Issue date Dec 11, 2012
- Tinggi Technologies Private Limited
- Shu Yuan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR INSPECTING A WAFER
- Publication number 20190033233
- Publication date Jan 31, 2019
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali AMANULLAH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATICALLY VERIFYING CORRECT DIE REMOVAL...
- Publication number 20160125583
- Publication date May 5, 2016
- ASTI HOLDINGS LIMITED
- Ajharali AMANULLAH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20150233840
- Publication date Aug 20, 2015
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY CORRECTING FOR ROTATIONAL MISAL...
- Publication number 20150228522
- Publication date Aug 13, 2015
- Semiconductor Technologies & Instruments Pte Ltd
- Jing Lin
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20100188486
- Publication date Jul 29, 2010
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOCALIZED ANNEALING DURING SEMICONDUCTOR DEVICE FABRICATION
- Publication number 20100047996
- Publication date Feb 25, 2010
- Tinggi Technologies Private Limited
- Shu Yuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Patterned wafer defect inspection system and method
- Publication number 20090034831
- Publication date Feb 5, 2009
- ASTI Holdings Limited
- Ajharali Amanullah
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

System and method for inspecting a wafer

System and method for inspecting a wafer

System and method for automatically correcting for rotational misal...

Systems and methods for automatically verifying correct die removal...

Patterned wafer defect inspection system and method

Localized annealing during semiconductor device fabrication

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR INSPECTING A WAFER

SYSTEMS AND METHODS FOR AUTOMATICALLY VERIFYING CORRECT DIE REMOVAL...

System and method for inspecting a wafer

SYSTEM AND METHOD FOR AUTOMATICALLY CORRECTING FOR ROTATIONAL MISAL...

System and method for inspecting a wafer

LOCALIZED ANNEALING DURING SEMICONDUCTOR DEVICE FABRICATION

Patterned wafer defect inspection system and method