Lin Lee CHEONG

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer bin map based root cause analysis
- Patent number 12,229,945
- Issue date Feb 18, 2025
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Collaborative learning model for semiconductor applications
- Patent number 12,038,802
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rational decision-making tool for semiconductor processes
- Patent number 11,775,714
- Issue date Oct 3, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer bin map based root cause analysis
- Patent number 11,763,446
- Issue date Sep 19, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Anomalous equipment trace detection and classification
- Patent number 11,609,812
- Issue date Mar 21, 2023
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of hot spots or defects by machine learning
- Patent number 11,443,083
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Jing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect prediction
- Patent number 11,403,453
- Issue date Aug 2, 2022
- ASML Netherlands B.V.
- Lin Lee Cheong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Maintenance scheduling for semiconductor manufacturing equipment
- Patent number 11,295,993
- Issue date Apr 5, 2022
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for determining an approximate value of a processing parame...
- Patent number 11,126,092
- Issue date Sep 21, 2021
- ASML Netherlands B.V.
- Lin Lee Cheong
- G05 - CONTROLLING REGULATING
Information Patent Grant
Failure detection and classsification using sensor data and/or meas...
- Patent number 11,029,359
- Issue date Jun 8, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor yield prediction
- Patent number 11,022,642
- Issue date Jun 1, 2021
- PDF Solutions, Inc.
- Jeffrey Drue David
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective inclusion/exclusion of semiconductor chips in accelerated...
- Patent number 10,777,470
- Issue date Sep 15, 2020
- PDF Solutions, Inc.
- Lin Lee Cheong
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer Bin Map Based Root Cause Analysis
- Publication number 20230377132
- Publication date Nov 23, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Rational Decision-Making Tool for Semiconductor Processes
- Publication number 20220327268
- Publication date Oct 13, 2022
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING
- Publication number 20220277116
- Publication date Sep 1, 2022
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Bin Map Based Root Cause Analysis
- Publication number 20210342993
- Publication date Nov 4, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Rational Decision-Making Tool for Semiconductor Processes
- Publication number 20210294950
- Publication date Sep 23, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT PREDICTION
- Publication number 20210150115
- Publication date May 20, 2021
- ASML NETHERLANDS B.V.
- Lin Lee CHEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Collaborative Learning Model for Semiconductor Applications
- Publication number 20210142122
- Publication date May 13, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Anomalous Equipment Trace Detection and Classification
- Publication number 20210103489
- Publication date Apr 8, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAINTENANCE SCHEDULING FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20200388545
- Publication date Dec 10, 2020
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE INCLUSION/EXCLUSION OF SEMICONDUCTOR CHIPS IN ACCELERATED...
- Publication number 20190304849
- Publication date Oct 3, 2019
- STREAMMOSAIC, INC.
- Lin Lee Cheong
- G01 - MEASURING TESTING
Information Patent Application
FAILURE DETECTION AND CLASSSIFICATION USING SENSOR DATA AND/OR MEAS...
- Publication number 20190277913
- Publication date Sep 12, 2019
- STREAMMOSAIC, INC.
- Tomonori D. Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING
- Publication number 20190147127
- Publication date May 16, 2019
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR YIELD PREDICTION
- Publication number 20190064253
- Publication date Feb 28, 2019
- STREAMMOSAIC, INC.
- Jeffrey Drue David
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR IDENTIFYING A PROCESS WINDOW BOUNDARY
- Publication number 20180329311
- Publication date Nov 15, 2018
- ASML Netherland B.V.
- Lin Lee CHEONG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Lin Lee CHEONG

Person

Patents Grantslast 30 patents

Wafer bin map based root cause analysis

Collaborative learning model for semiconductor applications

Rational decision-making tool for semiconductor processes

Wafer bin map based root cause analysis

Anomalous equipment trace detection and classification

Identification of hot spots or defects by machine learning

Defect prediction

Maintenance scheduling for semiconductor manufacturing equipment

Methods for determining an approximate value of a processing parame...

Failure detection and classsification using sensor data and/or meas...

Semiconductor yield prediction

Selective inclusion/exclusion of semiconductor chips in accelerated...

Patents Applicationslast 30 patents

Wafer Bin Map Based Root Cause Analysis

Rational Decision-Making Tool for Semiconductor Processes

IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING

Wafer Bin Map Based Root Cause Analysis

Rational Decision-Making Tool for Semiconductor Processes

DEFECT PREDICTION

Collaborative Learning Model for Semiconductor Applications

Anomalous Equipment Trace Detection and Classification

MAINTENANCE SCHEDULING FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT

SELECTIVE INCLUSION/EXCLUSION OF SEMICONDUCTOR CHIPS IN ACCELERATED...

FAILURE DETECTION AND CLASSSIFICATION USING SENSOR DATA AND/OR MEAS...

IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING

SEMICONDUCTOR YIELD PREDICTION

METHODS FOR IDENTIFYING A PROCESS WINDOW BOUNDARY