Lin ZHAO

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Defect localization in embedded memory
- Patent number 11,639,959
- Issue date May 2, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat (Wu Shifa) Goh
- G01 - MEASURING TESTING
Information Patent Grant
Defect localization in embedded memory
- Patent number 10,962,592
- Issue date Mar 30, 2021
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat (Wu Shifa) Goh
- G01 - MEASURING TESTING
Information Patent Grant
Defect isolation methods and systems
- Patent number 9,958,502
- Issue date May 1, 2018
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat Goh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT LOCALIZATION IN EMBEDDED MEMORY
- Publication number 20210199715
- Publication date Jul 1, 2021
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat (Wu Shifa) GOH
- G01 - MEASURING TESTING
Information Patent Application
DEFECT LOCALIZATION IN EMBEDDED MEMORY
- Publication number 20200081061
- Publication date Mar 12, 2020
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat (Wu Shifa) GOH
- G01 - MEASURING TESTING
Information Patent Application
DEFECT ISOLATION METHODS AND SYSTEMS
- Publication number 20160161556
- Publication date Jun 9, 2016
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat GOH
- G01 - MEASURING TESTING