Linard Karklin

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 7,835,565
- Issue date Nov 16, 2010
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 7,565,001
- Issue date Jul 21, 2009
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection and verification system
- Patent number 7,523,027
- Issue date Apr 21, 2009
- Synopsys, Inc.
- Fang-Cheng Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 7,403,649
- Issue date Jul 22, 2008
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 7,254,251
- Issue date Aug 7, 2007
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
Visual analysis and verification system using advanced tools
- Patent number 7,107,571
- Issue date Sep 12, 2006
- Synopsys, Inc.
- Fang-Cheng Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of providing mask quality control
- Patent number 6,925,202
- Issue date Aug 2, 2005
- Synopsys, Inc.
- Linard Karklin
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing mask defect printability analysis
- Patent number 6,873,720
- Issue date Mar 29, 2005
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection and verification system
- Patent number 6,757,645
- Issue date Jun 29, 2004
- Numerical Technologies, Inc.
- Fang-Cheng Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for a network-based mask defect printability a...
- Patent number 6,578,188
- Issue date Jun 10, 2003
- Numerical Technologies, Inc.
- Linyong Pang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System And Method Of Providing Mask Defect Printability Analysis
- Publication number 20090245621
- Publication date Oct 1, 2009
- Synopsys, Inc,
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
System And Method Of Providing Mask Defect Printability Analysis
- Publication number 20080260235
- Publication date Oct 23, 2008
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
System And Method Of Providing Mask Defect Printablity Analysis
- Publication number 20070292017
- Publication date Dec 20, 2007
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
System and method of providing mask defect printability analysis
- Publication number 20050190957
- Publication date Sep 1, 2005
- Synopsys, Inc.
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
Visual inspection and verification system
- Publication number 20040243320
- Publication date Dec 2, 2004
- Numerical Technologies, Inc.
- Fang-Cheng Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
User interface for a network-based mask defect printability analysi...
- Publication number 20030126581
- Publication date Jul 3, 2003
- NUMERICAL TECHNOLOGIES, INC.
- Linyong Pang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method of providing mask defect printability analysis
- Publication number 20020164065
- Publication date Nov 7, 2002
- Numerical Technologies
- Lynn Cai
- G01 - MEASURING TESTING
Information Patent Application
System and method of providing mask quality control
- Publication number 20020164064
- Publication date Nov 7, 2002
- Numerical Technologies, Inc.
- Linard Karklin
- G01 - MEASURING TESTING
Information Patent Application
Visual analysis and verification system using advanced tools
- Publication number 20020035461
- Publication date Mar 21, 2002
- NUMERICAL TECHNOLOGIES, INC.
- Fang-Cheng Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VISUAL INSPECTION AND VERIFICATION SYSTEM
- Publication number 20020019729
- Publication date Feb 14, 2002
- NUMERICAL TECHNOLOGIES, INC.
- FANG-CHENG CHANG
- G06 - COMPUTING CALCULATING COUNTING

Linard Karklin

Person

Patents Grantslast 30 patents

System and method of providing mask defect printability analysis

System and method of providing mask defect printability analysis

Visual inspection and verification system

System and method of providing mask defect printability analysis

System and method of providing mask defect printability analysis

Visual analysis and verification system using advanced tools

System and method of providing mask quality control

System and method of providing mask defect printability analysis

Visual inspection and verification system

Method and apparatus for a network-based mask defect printability a...

Patents Applicationslast 30 patents

System And Method Of Providing Mask Defect Printability Analysis

System And Method Of Providing Mask Defect Printability Analysis

System And Method Of Providing Mask Defect Printablity Analysis

System and method of providing mask defect printability analysis

Visual inspection and verification system

User interface for a network-based mask defect printability analysi...

System and method of providing mask defect printability analysis

System and method of providing mask quality control

Visual analysis and verification system using advanced tools

VISUAL INSPECTION AND VERIFICATION SYSTEM