Linda Milor

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Stanford, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detection of undesired connection between conductive structures wit...
- Patent number 6,448,098
- Issue date Sep 10, 2002
- Advanced Micro Devices, Inc.
- Linda S. Milor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection of undesired connection between conductive structures wit...
- Patent number 6,054,721
- Issue date Apr 25, 2000
- Advanced Micro Devices, Inc.
- Linda S. Milor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for providing an interconnect layout to reduce de...
- Patent number 5,986,477
- Issue date Nov 16, 1999
- Advanced Micro Devices, Inc.
- Chun Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect diagnosis using simulation for IC yield improvement
- Patent number 5,886,909
- Issue date Mar 23, 1999
- Advanced Micro Devices, Inc.
- Linda Milor
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methodology to improve the performance of integrated circuits by ex...
- Publication number 20020073388
- Publication date Jun 13, 2002
- Michael E. Orshansky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methodology for increasing yield, manufacturability, and performanc...
- Publication number 20020073394
- Publication date Jun 13, 2002
- Linda Susan Milor
- G06 - COMPUTING CALCULATING COUNTING