TREA

Linglan Zhang

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  • Shanghai, CN
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Patents Grantslast 30 patents

  • Information Patent Grant

    Chip and chip test method
    • Patent number 12,019,117
    • Issue date Jun 25, 2024
    • Shanghai Biren Technology Co., Ltd
    • Kai Lei
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chip and chip testing method
    • Patent number 11,835,595
    • Issue date Dec 5, 2023
    • Shanghai Biren Technology Co., Ltd
    • Kai Lei
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Clock step control circuit and method thereof
    • Patent number 11,381,245
    • Issue date Jul 5, 2022
    • Shanghai Biren Technology Co., Ltd
    • Zheng Tian
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents