Linlin Liu

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Test structure and method for judging de-embedding accuracy of RF d...
- Patent number 10,520,543
- Issue date Dec 31, 2019
- Shanghai IC R&D Center Co., Ltd.
- Linlin Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...
- Publication number 20240369612
- Publication date Nov 7, 2024
- Shanghai IC R&D Center Co., Ltd.
- Linlin LIU
- G01 - MEASURING TESTING
Information Patent Application
MEANS FOR REDUCING FINFET PARASITIC RESISTANCE
- Publication number 20190296011
- Publication date Sep 26, 2019
- Shanghai IC R&D Center Co., Ltd.
- Ao GUO
- C01 - INORGANIC CHEMISTRY
Information Patent Application
METHOD AND SYSTEM FOR TESTING OPTIMIZATION AND MOLDING OPTIMIZATION...
- Publication number 20190179991
- Publication date Jun 13, 2019
- Shanghai IC R&D Center Co., Ltd.
- Linlin Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST STRUCTURE AND METHOD FOR JUDGING DE-EMBEDDING ACCURACY OF RF D...
- Publication number 20170285098
- Publication date Oct 5, 2017
- Shanghai IC R&D Center Co., Ltd.
- Linlin Liu
- G01 - MEASURING TESTING