Linus Meier

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Effretikon, CH

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining the necessity of adjusting a high-resolution...
- Patent number 5,056,050
- Issue date Oct 8, 1991
- Mettler-Toledo AG
- Fritz Fuchs
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument display with exchangeable legends for differen...
- Patent number 4,567,481
- Issue date Jan 28, 1986
- Mettler Instrumente AG
- Linus Meier
- G01 - MEASURING TESTING
Information Patent Grant
Weighing apparatus for producing geographically-corrected measurements
- Patent number 4,512,429
- Issue date Apr 23, 1985
- Mettler Instruments AG
- Linus Meier
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus
- Patent number 4,113,436
- Issue date Sep 12, 1978
- Mettler Instrumente AG
- Roger Daniel Werder
- G01 - MEASURING TESTING