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Patents Grants
last 30 patents
Information
Patent Grant
Area array detector, detection method, and corresponding container/...
Patent number
12,306,359
Issue date
May 20, 2025
Nuctech Company Limited
Linxia Tan
G01 - MEASURING TESTING
Information
Patent Grant
Gathering and sampling device and inspection apparatus
Patent number
10,782,211
Issue date
Sep 22, 2020
Tsinghua University
Qingjun Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Darkroom type security inspection apparatus and method
Patent number
10,281,431
Issue date
May 7, 2019
Nuctech Company Limited
Qingjun Zhang
G01 - MEASURING TESTING
Information
Patent Grant
General sample injector, gas chromatograph and combined spectrometer
Patent number
9,618,484
Issue date
Apr 11, 2017
Nuctech Company Limited
Qingjun Zhang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AREA ARRAY DETECTOR, DETECTION METHOD, AND CORRESPONDING CONTAINER/...
Publication number
20230168397
Publication date
Jun 1, 2023
Nuctech Company Limited
Linxia TAN
G01 - MEASURING TESTING
Information
Patent Application
GATHERING AND SAMPLING DEVICE AND INSPECTION APPARATUS
Publication number
20180188138
Publication date
Jul 5, 2018
TSINGHUA UNIVERSITY
Qingjun Zhang
G01 - MEASURING TESTING
Information
Patent Application
DARKROOM TYPE SECURITY INSPECTION APPARATUS AND METHOD
Publication number
20170138902
Publication date
May 18, 2017
Nuctech Company Limited
Qingjun ZHANG
G01 - MEASURING TESTING
Information
Patent Application
GENERAL SAMPLE INJECTOR, GAS CHROMATOGRAPH AND COMBINED SPECTROMETER
Publication number
20150185189
Publication date
Jul 2, 2015
Nuctech Company Limited
Qingjun ZHANG
G01 - MEASURING TESTING