Lioba Kuschel

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Mannheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Microscope and a method for examining a sample using a microscope
- Patent number 9,411,141
- Issue date Aug 9, 2016
- Leica Microsystems CMS GmbH
- Frank Schreiber
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for investigating a sample with regard to the...
- Patent number 9,274,057
- Issue date Mar 1, 2016
- Leica Microsystems CMS GmbH
- Juergen Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for recognizing dark states during the spectrosco...
- Patent number 7,446,322
- Issue date Nov 4, 2008
- Leica Microsystems CMS GmbH
- Juergen Riedmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPE AND A METHOD FOR EXAMINING A SAMPLE USING A MICROSCOPE
- Publication number 20150286040
- Publication date Oct 8, 2015
- Leica Microsystems CMS GmbH
- Frank Schreiber
- G02 - OPTICS
Information Patent Application
Method and Apparatus for Investigating a Sample with Regard to the...
- Publication number 20150123013
- Publication date May 7, 2015
- Leica Microsystems CMS GmbH
- Juergen Schneider
- G02 - OPTICS
Information Patent Application
Method and device for recognizing dark states during the spectrosco...
- Publication number 20060186345
- Publication date Aug 24, 2006
- Leica Microsystems CMS GmbH
- Juergen Riedmann
- G01 - MEASURING TESTING