Lior Levin

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for defect localization on electrical test struct...
- Patent number 7,969,564
- Issue date Jun 28, 2011
- Applied Materials Israel, Ltd.
- Gilad Almogy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for defect localization on electrical test struct...
- Publication number 20060192904
- Publication date Aug 31, 2006
- Gilad Almogy
- G01 - MEASURING TESTING