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Lior Moheban
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Nes Ziona, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Hybrid FIFO buffer
Patent number
11,159,148
Issue date
Oct 26, 2021
Marvell Israel (M.I.S.L) Ltd.
Lior Moheban
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Systems and methods for transferring data with a dual-line first-in...
Patent number
10,621,122
Issue date
Apr 14, 2020
Marvell Israel (M.I.S.L) Ltd.
Lior Moheban
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for transmitting signals over long distances o...
Patent number
10,581,433
Issue date
Mar 3, 2020
Marvell Israel (M.I.S.L) Ltd.
Lior Moheban
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Multi-level clock signal distribution network and integrated circuit
Patent number
9,459,651
Issue date
Oct 4, 2016
FREESCALE SEMICONDUCTOR, INC.
Lior Moheban
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for generating gate-level activity data for us...
Patent number
9,038,006
Issue date
May 19, 2015
FREESCALE SEMICONDUCTOR, INC.
Lior Moheban
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for testing a device
Patent number
8,302,065
Issue date
Oct 30, 2012
FREESCALE SEMICONDUCTOR, INC.
Oshri Shomrony
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for testing a circuit
Patent number
8,286,040
Issue date
Oct 9, 2012
FREESCALE SEMICONDUCTOR, INC.
Gal Malach
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING GATE-LEVEL ACTIVITY DATA FOR US...
Publication number
20140325461
Publication date
Oct 30, 2014
LIOR MOHEBAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTI-LEVEL CLOCK SIGNAL DISTRIBUTION NETWORK AND INTEGRATED CIRCUIT
Publication number
20140247080
Publication date
Sep 4, 2014
FREESCALE SEMICONDUCTOR, INC.
Lior Moheban
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE AND METHOD FOR TESTING A CIRCUIT
Publication number
20100090706
Publication date
Apr 15, 2010
FREESCALE SEMICONDUCTOR ,INC.
Gal Malach
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR TESTING A DEVICE
Publication number
20090206866
Publication date
Aug 20, 2009
FREESCALE SEMICONDUCTOR, INC.
Oshri Shomrony
G01 - MEASURING TESTING