Liqun Han

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems for incorporating LiDAR sensors in a headlamp module of a v...
- Patent number 11,592,527
- Issue date Feb 28, 2023
- Cepton Technologies, Inc.
- Mark A. McCord
- F21 - LIGHTING
Information Patent Grant
Systems for vibration cancellation in a lidar system
- Patent number 10,955,530
- Issue date Mar 23, 2021
- CEPTON TECHNOLOGIES, INC.
- Jun Pei
- G01 - MEASURING TESTING
Information Patent Grant
Scanning illuminated three-dimensional imaging systems
- Patent number 10,754,036
- Issue date Aug 25, 2020
- CEPTON TECHNOLOGIES, INC.
- Jun Pei
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Scanning apparatuses and methods for a lidar system
- Patent number 10,690,754
- Issue date Jun 23, 2020
- CEPTON TECHNOLOGIES, INC.
- Jun Pei
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam imaging with dual Wien-filter monochromator
- Patent number 9,443,696
- Issue date Sep 13, 2016
- KLA-Tencor Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for high-resolution electron beam imaging
- Patent number 9,053,900
- Issue date Jun 9, 2015
- KLA-Tencor Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tilt-imaging scanning electron microscope
- Patent number 8,921,782
- Issue date Dec 30, 2014
- KLA-Tencor Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-lens-gun electron beam apparatus and methods for high-resoluti...
- Patent number 8,859,982
- Issue date Oct 14, 2014
- KLA-Tencor Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical system for high-speed and high-sensitivity inspect...
- Patent number 8,664,594
- Issue date Mar 4, 2014
- KLA-Tencor Corporation
- Xinrong Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Suspended membrane calibration sample
- Patent number 8,614,427
- Issue date Dec 24, 2013
- KLA-Tencor Corporation
- Mark A. McCord
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam column and methods of using same
- Patent number 8,461,526
- Issue date Jun 11, 2013
- KLA-Tencor Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple-beam system for high-speed electron-beam inspection
- Patent number 8,362,425
- Issue date Jan 29, 2013
- KLA-Tencor Corporation
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Grant
High-sensitivity and high-throughput electron beam inspection colum...
- Patent number 8,294,125
- Issue date Oct 23, 2012
- KLA-Tencor Corporation
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Grant
Shielding, particulate reducing high vacuum components
- Patent number 8,092,927
- Issue date Jan 10, 2012
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Shielding, particulate reducing high vacuum components
- Patent number 7,919,193
- Issue date Apr 5, 2011
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Immersion gun equipped electron beam column
- Patent number 7,821,187
- Issue date Oct 26, 2010
- KLA-Tencor Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-speed electron beam inspection
- Patent number 7,315,022
- Issue date Jan 1, 2008
- KLA-Tencor Technologies Corporation
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection system using multiple electron beams and u...
- Patent number 6,774,646
- Issue date Aug 10, 2004
- KLA-Tencor Corporation
- Liqun Han
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OSCILLATING MIRRORS FOR LIDAR
- Publication number 20250035886
- Publication date Jan 30, 2025
- Cepton Technologies, Inc.
- Roger Cullumber
- G01 - MEASURING TESTING
Information Patent Application
3D OPTICAL SENSOR ALIGNMENT
- Publication number 20240212128
- Publication date Jun 27, 2024
- Cepton Technologies, Inc.
- Jun Pei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING LIDAR WITH DISCRETE VERTICAL STEPS
- Publication number 20240183950
- Publication date Jun 6, 2024
- Cepton Technologies, Inc.
- Jun Pei
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR INCORPORATING LIDAR SENSORS IN A HEADLAMP MODULE OF A V...
- Publication number 20190257922
- Publication date Aug 22, 2019
- Cepton Technologies, Inc.
- Mark A. McCord
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR VIBRATION CANCELLATION IN A LIDAR SYSTEM
- Publication number 20180180721
- Publication date Jun 28, 2018
- Cepton Tecnhologies, Inc.
- Jun PEI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING APPARATUSES AND METHODS FOR A LIDAR SYSTEM
- Publication number 20180180720
- Publication date Jun 28, 2018
- Cepton Tecnhologies, Inc.
- Jun PEI
- G01 - MEASURING TESTING
Information Patent Application
Scanning Illuminated Three-Dimensional Imaging Systems
- Publication number 20170310948
- Publication date Oct 26, 2017
- Cepton Technologies, Inc.
- Jun Pei
- B60 - VEHICLES IN GENERAL
Information Patent Application
ELECTRON BEAM IMAGING WITH DUAL WIEN-FILTER MONOCHROMATOR
- Publication number 20150340200
- Publication date Nov 26, 2015
- KLA-Tencor Corporation
- Xinrong JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TILT-IMAGING SCANNING ELECTRON MICROSCOPE
- Publication number 20140151552
- Publication date Jun 5, 2014
- KLA-Tencor Corporation
- Xinrong JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL-LENS-GUN ELECTRON BEAM APPARATUS AND METHODS FOR HIGH-RESOLUTI...
- Publication number 20140077077
- Publication date Mar 20, 2014
- Xinrong JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR HIGH-RESOLUTION ELECTRON BEAM IMAGING
- Publication number 20130256530
- Publication date Oct 3, 2013
- Xinrong JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE-BEAM SYSTEM FOR HIGH-SPEED ELECTRON-BEAM INSPECTION
- Publication number 20120241606
- Publication date Sep 27, 2012
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM COLUMN AND METHODS OF USING SAME
- Publication number 20120138791
- Publication date Jun 7, 2012
- Marian MANKOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shielding, Particulate Reducing High Vacuum Components
- Publication number 20110142382
- Publication date Jun 16, 2011
- KLA-Tencor Technologies Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
High-Sensitivity and High-Throughput Electron Beam Inspection Colum...
- Publication number 20110114838
- Publication date May 19, 2011
- Liqun HAN
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Systems for incorporating LiDAR sensors in a headlamp module of a v...

Systems for vibration cancellation in a lidar system

Scanning illuminated three-dimensional imaging systems

Scanning apparatuses and methods for a lidar system

Electron beam imaging with dual Wien-filter monochromator

Apparatus and methods for high-resolution electron beam imaging

Tilt-imaging scanning electron microscope

Dual-lens-gun electron beam apparatus and methods for high-resoluti...

Electron-optical system for high-speed and high-sensitivity inspect...

Suspended membrane calibration sample

Electron beam column and methods of using same

Multiple-beam system for high-speed electron-beam inspection

High-sensitivity and high-throughput electron beam inspection colum...

Shielding, particulate reducing high vacuum components

Shielding, particulate reducing high vacuum components

Immersion gun equipped electron beam column

High-speed electron beam inspection

Electron beam inspection system using multiple electron beams and u...

Patents Applicationslast 30 patents

OSCILLATING MIRRORS FOR LIDAR

3D OPTICAL SENSOR ALIGNMENT

SCANNING LIDAR WITH DISCRETE VERTICAL STEPS

SYSTEMS FOR INCORPORATING LIDAR SENSORS IN A HEADLAMP MODULE OF A V...

SYSTEMS FOR VIBRATION CANCELLATION IN A LIDAR SYSTEM

SCANNING APPARATUSES AND METHODS FOR A LIDAR SYSTEM

Scanning Illuminated Three-Dimensional Imaging Systems

ELECTRON BEAM IMAGING WITH DUAL WIEN-FILTER MONOCHROMATOR

TILT-IMAGING SCANNING ELECTRON MICROSCOPE

DUAL-LENS-GUN ELECTRON BEAM APPARATUS AND METHODS FOR HIGH-RESOLUTI...

APPARATUS AND METHODS FOR HIGH-RESOLUTION ELECTRON BEAM IMAGING

MULTIPLE-BEAM SYSTEM FOR HIGH-SPEED ELECTRON-BEAM INSPECTION

ELECTRON BEAM COLUMN AND METHODS OF USING SAME

Shielding, Particulate Reducing High Vacuum Components

High-Sensitivity and High-Throughput Electron Beam Inspection Colum...