Lisa E. Mullin

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Pottsville, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test device with heating circuit
- Patent number 7,804,291
- Issue date Sep 28, 2010
- Agere Systems Inc.
- Seung H. Kang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST DEVICE WITH HEATING CIRCUIT
- Publication number 20070168818
- Publication date Jul 19, 2007
- Agere Systems, Inc.
- Seung H. Kang
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test device with heating circuit
- Publication number 20060066335
- Publication date Mar 30, 2006
- Seung H. Kang
- G01 - MEASURING TESTING