Lisa R. Copenspire-Ross

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for measuring semiconductor devices
- Patent number 11,984,364
- Issue date May 14, 2024
- Anilkumar Chandolu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data transmission and remote activity monitoring
- Patent number 11,641,681
- Issue date May 2, 2023
- Micron Technology, Inc.
- Kristina L. Ming
- G08 - SIGNALLING
Information Patent Grant
Sharing data with a particular audience
- Patent number 11,630,924
- Issue date Apr 18, 2023
- Micron Technology, Inc.
- Bhagyashree Bokade
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for measuring semiconductor devices
- Patent number 10,971,409
- Issue date Apr 6, 2021
- Micron Technology, Inc.
- Anilkumar Chandolu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES
- Publication number 20240371706
- Publication date Nov 7, 2024
- Lodestar Licensing Group LLC
- Anilkumar Chandolu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING DRIVER CAPABILITY
- Publication number 20230329612
- Publication date Oct 19, 2023
- Micron Technology, Inc.
- Lisa R. Copenspire-Ross
- B60 - VEHICLES IN GENERAL
Information Patent Application
CLEANING DETECTION SYSTEM
- Publication number 20230057027
- Publication date Feb 23, 2023
- Micron Technology, Inc.
- Lisa R. Copenspire-Ross
- G05 - CONTROLLING REGULATING
Information Patent Application
DATA TRANSMISSION AND REMOTE ACTIVITY MONITORING
- Publication number 20220287112
- Publication date Sep 8, 2022
- Micron Technology, Inc.
- Kristina L. Ming
- G08 - SIGNALLING
Information Patent Application
SHARING DATA WITH A PARTICULAR AUDIENCE
- Publication number 20220067216
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Bhagyashree Bokade
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES
- Publication number 20210225715
- Publication date Jul 22, 2021
- Micron Technology, Inc.
- Anilkumar Chandolu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES
- Publication number 20200211912
- Publication date Jul 2, 2020
- Micron Technology, Inc.
- Anilkumar Chandolu
- H01 - BASIC ELECTRIC ELEMENTS

Lisa R. Copenspire-Ross

Person

Patents Grantslast 30 patents

Methods and systems for measuring semiconductor devices

Data transmission and remote activity monitoring

Sharing data with a particular audience

Methods and systems for measuring semiconductor devices

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES

DETERMINING DRIVER CAPABILITY

CLEANING DETECTION SYSTEM

DATA TRANSMISSION AND REMOTE ACTIVITY MONITORING

SHARING DATA WITH A PARTICULAR AUDIENCE

METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES

METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES