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Lisha Nie
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Beijing, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and systems for sampling k-space data in magnetic resonance...
Patent number
10,768,252
Issue date
Sep 8, 2020
General Electric Company
Lisha Nie
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for correcting uniformity of a magnetic resona...
Patent number
10,718,839
Issue date
Jul 21, 2020
GE Precision Healthcare LLC
Yongchuan Lai
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for calibrating center frequency of MR and MRI...
Patent number
10,690,742
Issue date
Jun 23, 2020
General Electric Company
Lisha Nie
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND SYSTEMS FOR SAMPLING K-SPACE DATA IN MAGNETIC RESONANCE...
Publication number
20200132793
Publication date
Apr 30, 2020
GENERAL ELECTRIC COMPANY
Lisha Nie
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI...
Publication number
20190302212
Publication date
Oct 3, 2019
GENERAL ELECTRIC COMPANY
Lisha Nie
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CORRECTING UNIFORMITY OF A MAGNETIC RESONA...
Publication number
20180120399
Publication date
May 3, 2018
GENERAL ELECTRIC COMPANY
Yongchuan Lai
G01 - MEASURING TESTING