Liwen FAN

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Amagasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Guide plate for a probe card and probe card provided with same
- Patent number 9,841,438
- Issue date Dec 12, 2017
- Japan Electronic Materials Corporation
- Teppei Kimura
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Guide plate for a probe card and probe card provided with same
- Patent number 9,535,096
- Issue date Jan 3, 2017
- Japan Electronic Materials Corporation
- Teppei Kimura
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
GUIDE PLATE FOR A PROBE CARD AND PROBE CARD PROVIDED WITH SAME
- Publication number 20170082657
- Publication date Mar 23, 2017
- Japan Electronic Materials Corporation
- Teppei KIMURA
- G01 - MEASURING TESTING
Information Patent Application
GUIDE PLATE FOR A PROBE CARD AND PROBE CARD PROVIDED WITH SAME
- Publication number 20150301083
- Publication date Oct 22, 2015
- Japan Electronic Materials Corporation
- Teppei KIMURA
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR